EKOP Model Parameters
33.1%
Theoretical Asymmetry32.8%
Fitted Model Value36.5% (True: 38%)
Likelihood Maximizer68 / day (True: 65)
Informed Trade Intensity26 / day (True: 25)
Uninformed Noise IntensityEKOP Microstructure Visualizer
Sensitivity: Event Probability ($\alpha$) vs Informed Arrival ($\mu$) on PIN (%)
Theoretical Probability of Informed Trading with fixed noise rate $\epsilon = 100$.
Sensitivity: Noise Rate ($\epsilon$) vs Informed Arrival ($\mu$) on PIN (%)
Impact of liquidity trading volume on information dilution with fixed $\alpha = 35\%$.
Mathematical Derivation: EKOP (1996) Structural Likelihood
1. Information Event Tree and Daily Trade Arrival
In the classic Easley, Kiefer, O'Hara, and Paperman (1996) framework, securities trade over discrete calendar days $d \in \{1, \dots, D\}$. Prior to the market open each day, an information event occurs with probability $\alpha$. If an event occurs, the news is bad ($L$) with probability $\delta$, or good ($H$) with probability $1-\delta$.
Throughout trading day $d$, orders arrive according to independent Poisson processes:
- Uninformed Liquidity Traders: Exogenously motivated buyers arrive at Poisson rate $\epsilon$, and sellers arrive at Poisson rate $\epsilon$.
- Informed Traders: If an information event occurs, privately informed traders enter the market at Poisson rate $\mu$. On good news days ($H$), they buy; on bad news days ($L$), they sell.
2. Daily Joint Probability Distribution
Conditional on the unobserved information state, the joint distribution of observed daily buys $B_d$ and sells $S_d$ is the mixture of three Poisson processes:
3. The Probability of Informed Trading (PIN)
The Probability of Informed Trading is defined as the expected fraction of daily orders originating from informed traders:
Higher values of PIN denote severe information asymmetry, wider dealer bid-ask spreads, and elevated adverse selection risks for passive market participants.
4. Numerically Stable Maximum Likelihood Estimation
Given $D$ independent trading days, the joint sample log-likelihood is:
To prevent floating-point overflow for large order counts ($B_d, S_d > 100$), the factorial terms $\ln(B_d!) + \ln(S_d!)$ are dropped from the objective function, and log-sum-exp factorization is applied:
Microstructure Concept Mastery Quiz
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